“…Rebecca J. Sichel, 1 Alexei Grigoriev, 1,a͒ Dal-Hyun Do, 1 Seung-Hyub Baek, 1 Ho-Won Jang, 1 Chad M. Folkman, 1 Chang-Beom Eom, 1 Zhonghou Cai, 2 Epitaxial BiFeO 3 thin films on miscut ͑001͒ SrTiO 3 substrates relax via mechanisms leading to an average rotation of the crystallographic axes of the BiFeO 3 layer with respect to the substrate. The angle of the rotation reaches a maximum in the plane defined by the surface normal of the film and the direction of the surface miscut.…”