2008
DOI: 10.1109/jmems.2008.921730
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Nanoscale Pattern Definition on Nonplanar Surfaces Using Ion Beam Proximity Lithography and Conformal Plasma-Deposited Resist

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Cited by 16 publications
(10 citation statements)
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“…These dry‐applied resists overcome the shortcomings associated with patterning using traditional solution‐deposited polymer photoresists 431, 432. The conformal nature of CVD allows application of resist layers onto non‐planar substrates 300, 433. Furthermore, eliminating “wet processing” prevents pattern collapse of high‐aspect‐ratio features during drying,434 avoids solvent residues and impurities,432, 434 and reduces the negative environmental impact associated with large volumes of solvent 300…”
Section: Example Applicationsmentioning
confidence: 99%
“…These dry‐applied resists overcome the shortcomings associated with patterning using traditional solution‐deposited polymer photoresists 431, 432. The conformal nature of CVD allows application of resist layers onto non‐planar substrates 300, 433. Furthermore, eliminating “wet processing” prevents pattern collapse of high‐aspect‐ratio features during drying,434 avoids solvent residues and impurities,432, 434 and reduces the negative environmental impact associated with large volumes of solvent 300…”
Section: Example Applicationsmentioning
confidence: 99%
“…That is a function of the particular application for which the accelerated particles are suitable. In next generation lithography technologies, the aim is to design systems capable of creating patterns of dimensions in the sub-100 nm domain [22].…”
Section: Discussionmentioning
confidence: 99%
“…Nanomanupulation plays major role in the field of nanofabrication. Nanomanupulation is a technique in which some specific tools are used to manipulate the objects in nanoscale (Parikh, 2008). At present, Scanning Probe microscopic methods involved in AFM [Davis, 2003) and Scanning Tunneling Microscopy (STM) are being used to manipulate the objects in nanometer scale.…”
Section: Introductionmentioning
confidence: 99%