1997
DOI: 10.1080/00218469708010531
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Nanoscale Indentation of Polymer Systems Using the Atomic Force Microscope

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Cited by 152 publications
(89 citation statements)
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“…In practice, the surface is rarely flat, and the tip apex may differ from an ideal sphere, leading to errors in the calculated modulus values. An additional complication is rotation (the lateral and buckling movement) of the AFM tip during cantilever deflection which produces tip-surface shear forces that are not accounted for in these models [11].…”
Section: Introductionmentioning
confidence: 99%
“…In practice, the surface is rarely flat, and the tip apex may differ from an ideal sphere, leading to errors in the calculated modulus values. An additional complication is rotation (the lateral and buckling movement) of the AFM tip during cantilever deflection which produces tip-surface shear forces that are not accounted for in these models [11].…”
Section: Introductionmentioning
confidence: 99%
“…Quantitative analyses of AFM data are complicated by problems relating to tip deformation and geometry, piezo hysteresis and creep, as well as an off-normal tip approach. [8][9][10] More recently, numerous AFM imaging techniques employing modulation have been developed. In these techniques, the changes in amplitude or phase response of an oscillating tip or sample as the tip is scanned over a heterogeneous sample can be used to map materials property variations.…”
Section: Introductionmentioning
confidence: 99%
“…Data point 2 reflects the second set of load curves of the sequence, made on the same Au/Cr/Si sample with 5 *1O MPa stress applied. The solid line represents the entire sequence of measurements (1)(2)(3)(4)(5)(6)(7)(8) performed on this sample. The elastic response measured with the sample unstressed, mounted on the sample stage, is shown by points 1,5 and 8.…”
Section: Resultsmentioning
confidence: 99%
“…By carefilly controlling the experiment, the relationship between load and deformation closely follows the classical Hertzian model for a rigid, non-interacting parabolic punch deforming an elastic half space, and is given by: F = E* (R1/2) d3/2 (2) where E* the measured modulus is given by: I/E*= ( l-vJ/Ei + 1-vJES and Ei = elastic modulus of indenter= 1100 GPa Es= elastic modulus of the sample d = indentation depth R = indenter radius Equation 2 relates the initial loading response of a surface to its elastic modulus. The indentation depth, d, is controlled using the z-piezo of the IFM, and the radius of the indenter, R, is determined from the SEM or probe characterize images.…”
Section: The Analysismentioning
confidence: 99%