Nanoscale electrical characterization of ambient-induced surface impurities on high-nickel cathode materials for lithium-ion batteries

Cho, Mingi; Lee, Sang Hoon; Yuk, Eunseo; Park, Hyeonho; Kim, Seong Heon

doi:10.1016/j.jallcom.2023.171215

Cited by 1 publication

(1 citation statement)

References 31 publications

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“…Although the resolution of common AFM is lower than that of STM, the AFM has also the advantage that it can be operated in various conditions of ambient air, vacuum, and specific gas. Furthermore, the most significant strength of AFM is that there are many AFM-based application modes, such as Kelvin probe force microscopy (KPFM), conductive AFM, and scanning spreading resistance microscopy [9][10][11][12][13][14][15][16][17]. These application modes make it possible to measure the nanoscale electrical properties of a sample, such as the work function, electrical current, electrical resistance, as well as the surface morphology [9][10][11][12][13][14][15][16][17].…”

Section: Introductionmentioning

confidence: 99%

Compact Light Illumination Module Using Laser Diode for Commercial Atomic Force Microscope

Park,

Yuk,

et al. 2023

Appl. Sci. Converg. Technol.

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Light absorption and emission phenomena are attractive topics in a wide range of research fields, because they can be applied to the development of optoelectronic devices. Nanoscale measurement tools with light illumination are important for investigating optoelectronic properties. In this study, we design and fabricate a bottom-illumination-type compact light illumination module with a laser diode. The module is successfully installed and operated in a commercial atomic force microscope (AFM) instrument. Using this module, we can locally illuminate a MoS 2 flake from the bottom and perform AFM measurements to reveal its thickness and size. In addition, photoconductive AFM (pc-AFM) can be conducted by measuring the current between the metallic tip and the sample in the dark and under illumination. The most important advantage of our light illumination module is that we can illuminate a specific sample area locally without illuminating the rest of the sample area. This module can be used for pc-AFM or Kelvin probe force microscopy study under illumination for various optoelectronic materials or devices.

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