“…For instance, STM has been used for imaging the process of selfassembled molecular systems, revealing the parameters involved in monolayer formation: physical parameters (i.e., concentration of solutes, wettability, contact angles, surface tension, temperature) and chemical parameters (i.e., molecular structure, orbital configuration) [3]. On the other hand, AFM is regularly used to characterize morphology of the bulk heterojunction (BHJ) blend in organic solar cells (OSCs) [4]. Besides AFM surface topography measurements, various electrical modes of AFM, such as Kelvin probe force microscopy (KPFM) and conductive-AFM (c-AFM), play an increasing role in understanding the influence of the nanoscale morphology of optoelectronics devices [4].…”