2012
DOI: 10.1109/tase.2012.2199753
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Nanorobotic Assembly and Focused Ion Beam Processing of Nanotube-Enhanced AFM Probes

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Cited by 29 publications
(18 citation statements)
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“…According to Lemma IV. 4, it is possible that v i−1 has been confirmed with three disks as v i−1 is an acute angle. Therefore, ω(v i−1 ) ≤ 3.…”
Section: Bounding the Number Of Probes Usedmentioning
confidence: 99%
See 1 more Smart Citation
“…According to Lemma IV. 4, it is possible that v i−1 has been confirmed with three disks as v i−1 is an acute angle. Therefore, ω(v i−1 ) ≤ 3.…”
Section: Bounding the Number Of Probes Usedmentioning
confidence: 99%
“…Metrology is used in many automation applications, such as semiconductor manufacturing and MEMS to inspect the shape of etched silicon structures ( [2], [19]) using scanning probe microscopy (SPM) ( [2], [3], [4]), and virtual metrology (VM) ( [7], [8]), which uses measurements of parameters during the production of wafers to statistically predict production properties. Proximity probes could also be relevant for sonar sensors in 2D and 3D (underwater) applications.…”
mentioning
confidence: 99%
“…By contrast, the CNTs provide a single point of contact with the cell, thus allowing this problem to be avoided and visualization of the true topography of the cell surface. More recently, a FIB technique has been reported to provide more accurate control over the CNT attachment procedure, although more work is needed to develop a high-throughput method for producing AFM-based cellular probes [42]. The readers are directed to a review by Wilson and Macpherson, which describes AFM tip attachment methods in greater detail [43].…”
Section: Tip-enhanced Raman Spectroscopymentioning
confidence: 99%
“…It is thus used for in situ electrical [3] or mechanical [4] characterisation, including mechanical characterisation of biological samples like cells [5]. In such experiments, the SEM can also be coupled with FIB (focused ion beam) [6] or STM (scanning tunneling microscope) [7] techniques. Challenges posed by the use of a typical SEM are largely related to the implementation of the experiment in the vacuum chamber and its operation under an electron beam.…”
Section: A Micro-robotic Manipulationmentioning
confidence: 99%