2018
DOI: 10.1080/08940886.2018.1506234
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Nanopositioning for the ESRF ID16A Nano-Imaging Beamline

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Cited by 26 publications
(20 citation statements)
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References 22 publications
(21 reference statements)
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“…The focus spot size was determined with a lithographic sample consisting of a 10 nm thick, 20 × 20 µm² square of nickel on a 500 nm thick SN membrane. The SN membranes holding the neurons were mounted in vacuum on a piezo nano-positioning stage with six short range actuators and regulated under the metrology of twelve capacitive sensors ( Villar et al, 2018 ). An ultra-long working distance optical microscope was used to bring the sample to the focal plane (depth-of-focus±3 µm) and to position the STED regions of interest in the X-ray beam (see section sample positioning below).…”
Section: Methodsmentioning
confidence: 99%
“…The focus spot size was determined with a lithographic sample consisting of a 10 nm thick, 20 × 20 µm² square of nickel on a 500 nm thick SN membrane. The SN membranes holding the neurons were mounted in vacuum on a piezo nano-positioning stage with six short range actuators and regulated under the metrology of twelve capacitive sensors ( Villar et al, 2018 ). An ultra-long working distance optical microscope was used to bring the sample to the focal plane (depth-of-focus±3 µm) and to position the STED regions of interest in the X-ray beam (see section sample positioning below).…”
Section: Methodsmentioning
confidence: 99%
“…The instrument developed at the ID16A beamline at the European Synchrotron (da Silva et al, 2017) can produce a highly brilliant and coherent X-ray probe focused to a spot below 30 nm, which we have used for holographic imaging. Another critical aspect is the accuracy of the rotational and translational stage movements to match the length scale of the expected resolution (< 100 nm); for this we employed active capacitive compensation to stabilize the sample (Villar et al, 2018). The sample itself must also remain stable throughout the measurements -a particular concern is heating and warping of the sample due to radiation absorption.…”
Section: Advances In Xnh Imaging Of Neural Circuitsmentioning
confidence: 99%
“…XRF measurements were done using the scanning X-ray fluorescence microscopy setup of the ID16A Nano-Imaging beamline of the ESRF (Grenoble) 64 . A pair of multilayer-coated Kirkpatrick-Baez mirrors located 185 m downstream of the undulator source, was used to focus the incident X-rays at the energy of 17 keV down to a 23 nm (horizontal) × 37 nm (vertical) spot size.…”
Section: Methodsmentioning
confidence: 99%