Nanometer-scale modification and characterization of lead-telluride surface by scanning tunneling microscope at 4.2 K

Abstract

Nanometer scale features on the semiconductor p-PbTe single crystal surface were created and studied at 4.2 K by means of a scanning tunneling microscope. Local tunneling spectra were obtained simultaneously with the surface topographic image. The local tunneling density of states and the magnetotransport data reveal the amorphous state of the modified regions on the surface.