1999
DOI: 10.1116/1.581755
|View full text |Cite
|
Sign up to set email alerts
|

Nanometer-scale compositional variations in III-V semiconductor heterostructures characterized by scanning tunneling microscopy

Abstract: Nanometer-scale compositional structure in InAs x P 1Ϫx /InN y As x P 1ϪxϪy //InP heterostructures grown by gas-source molecular beam epitaxy and in InAs 1Ϫx P x /InAs 1Ϫy Sb y /InAs heterostructures grown by metalorganic chemical vapor deposition has been characterized using cross-sectional scanning tunneling microscopy. InAs x P 1Ϫx alloy layers are found to contain As-rich and P-rich clusters with boundaries formed preferentially within ͑111͒ and ͑111͒ crystal planes. Similar compositional clustering is obs… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2001
2001
2021
2021

Publication Types

Select...
3
3

Relationship

1
5

Authors

Journals

citations
Cited by 10 publications
(2 citation statements)
references
References 46 publications
0
2
0
Order By: Relevance
“…Previously, the use of scanning tunneling microscopy (STM) to identify atomic ordering has been reported [117]. Conventional HRTEM imaging associated with diffraction pattern methods also can provide information about the atomic ordering [111,115,[118][119][120].…”
Section: Growth Mechanismsmentioning
confidence: 99%
“…Previously, the use of scanning tunneling microscopy (STM) to identify atomic ordering has been reported [117]. Conventional HRTEM imaging associated with diffraction pattern methods also can provide information about the atomic ordering [111,115,[118][119][120].…”
Section: Growth Mechanismsmentioning
confidence: 99%
“…The properties of a heterostructure composed of AlN and MoS 2 are affected by many factors. For example, lattice mismatch will cause a certain degree of piezoelectric polarization in AlN, and the properties at the interface including charge accumulation and potential energy steps will also be affected accordingly. , Due to the existence of a polarization effect, the accumulation of polarization charges at the interface will have an adjustment effect on the photoelectric properties of MoS 2 . However, there are few studies on the AlN/MoS 2 heterostructure in this field.…”
Section: Introductionmentioning
confidence: 99%