Nanomechanical Characterization of Indium Nano/Microwires

Abstract

Nanomechanical properties of indium nanowires like structures fabricated on quartz substrate by trench template technique, measured using nanoindentation. The hardness and elastic modulus of wires were measured and compared with the values of indium thin film. Displacement burst observed while indenting the nanowire. ‘Wire-only hardness’ obtained using Korsunsky model from composite hardness. Nanowires have exhibited almost same modulus as indium thin film but considerable changes were observed in hardness value.

Elastic Modulus Measurements on Large Diameter Nanowires Using a Nano-Assembled Platform

“…This is due to the large diameter NW being suspended across mechanical anchors (i.e., gold assembly electrodes) such that the aspect ratio of the sus pended NW segment is small (<3:1). Thus, the measurement comprises a combination of NW deformations observed in both, the nano-indentation and three-point bending modes, which have previously been reported for NW force spectroscopy measure ments [8][9][10][11][12][13][14][15][16],…”

“…The extraction of mechanical properties of a material system, irrespective of its scale, involves two components: (1) the controlled and precise application of a force (in terms of its magnitude, direction, and location of impact) and (2) an accurate measurement of the material deformation/displacement, which is caused by the applied external force. In the case of materials and structures with nanoscopic dimensions, approaches that entail the in situ application of the force stimuli within electron or scanning probe microscopes have commonly been employed over the past decade to extract mechanical proper ties such as Young's modulus, hardness, and tensile strength [5][6][7][8][9][10][11][12][13][14][15][16]. In the case of electron microscopes, the force stimuli are typically applied using AFM cantilevers or nanorobotic manipula tion systems, and the electron micrographs are employed to obtain the resulting material deformation/displacement.…”

“…Another widely used technique to characterize the mechanical behavior of nanomaterials involves force spectroscopy performed with an AFM in the contact mode [8][9][10][11][12][13][14][15][16]. In this method, a known force is exerted on the sample by pushing a precisely calibrated AFM tip (in terms of its mechanical stiffness) against it and the resulting material deflection/deformation is estimated from the associated movement of the piezosystem that controls the sample stage height.…”

“…There are two sample configurations in which AFM-based force spectroscopy is commonly performed on low-dimensional nanosystems: (1) three-point bending mode [8][9][10] where the NW is suspended between mechanical anchors at its ends in order to form a doubly clamped beam and the AFM tip is pushed against the NW at its midlengths to deform it. This configuration is employed with high-aspect ratio, small-diameter (<100 nm) NWs, and (2) nano-indentation mode [11][12][13][14][15][16], in which the NW is placed firmly on top of a substrate and the AFM tip pushes the NW surface to induce radial deformation in it. This approach is more common with low-aspect ratio, large diameter NW systems (>100nm).…”

Nanoindentation im Kristall‐Engineering: Quantifizierung mechanischer Eigenschaften von Molekülkristallen

“…[10,11] rialien. Durch die Entwicklung der Nanoindentation ist nun aber die Gewinnung quantitativer und genauer experimenteller Informationen über das mechanische Verhalten von kleinen Materialvolumen mçglich geworden.…”