Nanomaterial Characterization by X‐ray Scattering Techniques

Giannini, Cinzia; Siliqi, Dritan; Altamura, Davide

doi:10.1002/9781118742655.ch10

Cited by 2 publications

(1 citation statement)

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“…The profile, fitted by means of the GNOM program [49], corresponds to a gyration radius R g = 8.6 nm and to a distribution of interatomic distances, known as pair distribution function (PDF [50][51][52]), reported in the inset, of nanoparticles with spherical shape. Indeed, the PDF changes with the shape of the scattering objects, as described by the simulations in Figure 5b [53]. The mean size of the nanoparticles, derived from R g , is D = 2ˆ'5/3ˆR g~2 2˘1 nm.…”

Section: Nanoparticles In Watermentioning

confidence: 91%

X-ray Diffraction: A Powerful Technique for the Multiple-Length-Scale Structural Analysis of Nanomaterials

et al. 2016

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During recent decades innovative nanomaterials have been extensively studied, aiming at both investigating the structure-property relationship and discovering new properties, in order to achieve relevant improvements in current state-of-the art materials. Lately, controlled growth and/or assembly of nanostructures into hierarchical and complex architectures have played a key role in engineering novel functionalized materials. Since the structural characterization of such materials is a fundamental step, here we discuss X-ray scattering/diffraction techniques to analyze inorganic nanomaterials under different conditions: dispersed in solutions, dried in powders, embedded in matrix, and deposited onto surfaces or underneath them.

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