ASME 2019 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystem 2019
DOI: 10.1115/ipack2019-6471
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Nanoindentation Testing of SAC305 Solder Joints Subjected to Thermal Cycling Loading

Abstract: Solder joints in electronic packages are frequently exposed to thermal cycling environment. Such exposures can occur in real life application as well as in accelerated thermal cycling tests used for the fatigue behavior characterization. Because of temperature variations and CTE mismatches of the assembly materials, cyclic temperature leads to damage accumulation and material property evolution in the solder joints. This eventually results in crack initiation, and subsequent crack growth and failure. … Show more

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Cited by 11 publications
(1 citation statement)
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“…Electronic packages composed of various components such as a solder joint, silicon die, mold compound, and solder mask are frequently subjected to a thermal cycling loading in real-life applications [21]. Temperature variations' incorporation with mismatches of coefficients of thermal expansion among the assembly components leads to crack growth, damage accumulation and final failure [22]. It is important to monitor the temperature to prevent a thermal fatigue failure.…”
Section: Introductionmentioning
confidence: 99%
“…Electronic packages composed of various components such as a solder joint, silicon die, mold compound, and solder mask are frequently subjected to a thermal cycling loading in real-life applications [21]. Temperature variations' incorporation with mismatches of coefficients of thermal expansion among the assembly components leads to crack growth, damage accumulation and final failure [22]. It is important to monitor the temperature to prevent a thermal fatigue failure.…”
Section: Introductionmentioning
confidence: 99%