Nanoelectronics and Scanning Tunneling Engineering

Schneiker, Conrad; Hameroff, Stuart R.; Voelker, Mark A.; He, Jackson D.; Dereniak, Eustace L.; McCuskey, Robert S.

doi:10.1007/978-1-4615-7482-8_43

Cited by 3 publications

(3 citation statements)

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“…Nanotechnology It is being recognized that the STM can be employed as a nanoscale manipulation engineering tool to handle atoms and to modify individual molecules in a manner predicted by Feynman [149,63,14]. Becker et al [15] seem to have placed a single atom onto a germanium surface.…”

Section: Visualizationmentioning

confidence: 99%

<title>Scanning probe microscopy: trends and image processing issues</title>

Pingali

Jain

1993

Machine Vision Applications in Industrial Inspection

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Scanning probe microscopy (SXM or SPM) indudes techniques SUCh as scanning tunneling microscopy (STM), atomic force microscopy (AFM), magnetic force microscopy (MFM) and scanning ion conductance microscopy (SICM). Scanning probe microscopes have started a new era in microscopy by providing depth maps at an unprecedented resolution. These versatile devices work in vacuum, air, liquids, and aqueous solutions. Their resolution can be varied from the atomic range to the micrometer range. Scanning probe microscopy is being recognized as a powerful imaging technique in a variety of application areas. Not only can SXM image surface topography, but also other surface characteristics such as magnetic domains, electrical charge, local density of electron states, and surface temperature. Promising results using SXM have been obtained in imaging semiconductors, metals, organic materials, superconductors, and biological samples. SXM is already being used in some industrial applications and there is immense potential in applying it for surface characterization, metrology, and inspection in numerous applications. Image processing techniques are a vital complement to sensor technology in scanning probe microscopes. Image analysis and understanding techniques are essential if the potential of SXM for metrology and industrial inspection is to be realized. . In this paper we present an overview of the state of the art in SXM with emphasis on image processing techniques for SXM. We outline the principle of operation of different scanning probe microscopes. Issues related to sensor technology are discussed. Commercially available scanning probe microscopes are listed and their features summarized. We review in detail the image processing work that has been done to date in relation to SXM and raise relevant issues. Existing and potential applications of SXM are discussed. Finally, we point out directions for future research in image processing related to SXM.

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Section: Visualizationmentioning

confidence: 99%

<title>Scanning probe microscopy: trends and image processing issues</title>

Pingali

Jain

1993

Machine Vision Applications in Industrial Inspection

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“…Analogous sensors may be derived using optical tunnelling, near field optics, and related microscopy technology described by Pohl et al (1984,1985), Fischer et al (1981,1982,1986,1988), Dung et al (1985a( , b) Binnig et al (1985a, Allan (1985) De Brabander et al (1989, Hartline (1979), Harootunian et al (1986, Lewis et al (1984), Shoulders (1965) and Betzig er al. (1986).…”

Section: Tunnelling Nanosensors and Nanoswitchesmentioning

confidence: 99%

“…However, the invention of the STM immediately suggested a somewhat simpler alternative. The application of STM technology to implement Feynman's programme was first described by Schneiker in 1985 and subsequently (Schneiker, 1986a, b;Schneiker & Hameroff, 1988;Schneiker et al, 1989). We coined the term STM/FM to refer to nanoscale/molecular devices implemented by STM derived technologies.…”

Section: Introductionmentioning

confidence: 99%

Scanning tunnelling engineering

Schneiker

Hameroff

Voelker

et al. 1988

Journal of Microscopy

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It is difficult to suppress one's enthusiasm for the development of a viable molecular technological base when one recognizes the possible scientific, industrial and economic spin-off opportunities.-Forrest L . Carter, 1981[Consider] the final questions as to whether, ultimately . . . we can arrange the atoms the way we want, the vety atoms, all the way down!. . . Ultimately, we can do chemical synthesis. . . . [If] your machine is only 100 a t m high, you only have to have it correct to one-half of one per cent to make sure the other machine is exactly the same size-namely, 100 atoms high! . . . We can use, not just circuits, but some system involving the quantized energy levels, or the interactions of quantized spins, etc.. . .In the year 2000, when they look back at this age, they will wonder why it was not until the year 1960 that anybody began seriously to move in this direction.-Richard P . Feynman, 1959 SUMMARYThe great potential for building molecular scale machines and other structures was first noted by Richard Feynman (1960). He also proposed the development of tools to construct nanoscale mechanisms and devices. The range of technology that he proposed is now called nanotechnology, a term coined by Taniguchi (1974). Emergence of STM and related technology should greatly facilitate the development of nanotechnology in the decades to come. Franks' (1987b) review of nanotechnology notes the tremendous potential of STM-derived tools for what he terms 'scanningtunnelingengineen'ng'. However, STM technology can also augment the 'bottom up' approaches to nanotechnology, exemplified for example by Forrest Carter's ( 1979, Editors' comment: It will be recogruzed by readers of this paper that neither does its structure nor its approach follow that of papers normally published in the Journal. We felt however that it is undeniably interesting and include it in the issues associated with the STM meeting as, if not a preview, certainly an alternative view. 585

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Molecular Computing

Conrad¹

1990

Advances in Computers

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Nanoelectronics and Scanning Tunneling Engineering

Cited by 3 publications

References 58 publications

<title>Scanning probe microscopy: trends and image processing issues</title>

<title>Scanning probe microscopy: trends and image processing issues</title>

Scanning tunnelling engineering

Molecular Computing

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