1999
DOI: 10.1116/1.590824
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Nanoelectronic device applications of a chemically stable GaAs structure

Abstract: Janes, David B.; Kolagunta, V. R.; Batistuta, M.; Walsh, B. L.; Andres, Ronald P.; Liu, Jia; Dicke, J.; Lauterbach, J.; Pletcher, T.; Chen, E. H.; Melloch, Michael R.; Peckham, E. L.; Ueng, H. J.; Woodall, Jerry M.; Lee, Takhee; Reifenberger, R.; Kubiak, C. P.; and Kasibhatla, B., "Nanoelectronic device applications of a chemically stable GaAs structure" (1999 We report on nanoelectronic device applications of a nonalloyed contact structure which utilizes a surface layer of low-temperature grown GaAs as a chem… Show more

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Cited by 10 publications
(5 citation statements)
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References 15 publications
(11 reference statements)
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“…27 The difference in the contact properties between the samples can be qualitatively explained by the better surface stability of p-doped LTG:GaAs and the presence of mid-gap states near the Fermi level in this material. 26,27 The I(V) shape difference between measurements over the cluster and over the XYL-coated surface can also be qualitatively explained by the work function difference between the Au nanocluster and the Pt/Ir tip and the resulting surface barrier height difference between the two cases.…”
Section: Resultsmentioning
confidence: 95%
“…27 The difference in the contact properties between the samples can be qualitatively explained by the better surface stability of p-doped LTG:GaAs and the presence of mid-gap states near the Fermi level in this material. 26,27 The I(V) shape difference between measurements over the cluster and over the XYL-coated surface can also be qualitatively explained by the work function difference between the Au nanocluster and the Pt/Ir tip and the resulting surface barrier height difference between the two cases.…”
Section: Resultsmentioning
confidence: 95%
“…Retarding field energy analyzers (RFEA's) have been used to measure IEDs at grounded [1][2][3][4][5][6][7][8][9][10][11][12][13] and driven electrodes [14][15][16][17][18][19][20] in rf discharges in recent decades. The RFEA has been employed mostly at grounded surfaces as this simplifies the RFEA data acquisition electronics.…”
Section: Introductionmentioning
confidence: 99%
“…Measurements made at rf driven electrodes are more difficult but have been achieved using techniques that allow the RFEA (and measurement electronics) to float at rf bias potential. The list of references [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20] is by no means all inclusive but along with the references therein should serve as a useful overview of the important contributions and advances made by precedent researchers. Here, a floating RFEA design is presented for use at either a grounded or rf driven electrode in a plasma discharge.…”
Section: Introductionmentioning
confidence: 99%
“…The ability to modify the chemistry of a surface yet retain the bulk properties of the substrate has profound importance for many and diverse applications. Some of these applications include tribology, interfacial bonding, corrosion inhibition, diffusion barriers for metallic diffusion into dielectrics, passivation layers for II−VI and III−V compound semiconductors, improvement of substrate biocompatibility, and promotion of the wetting of metals deposited on dielectrics. In particular, 3-mercaptopropyltrimethoxysilane has been used for passivation of Ga−As, for copper chemical vapor deposition, , as a heavy metal ion adsorbent, and for protein immobilization. , However, despite the potential widespread application of molecular layer chemistry little work has been undertaken to characterize the growth of short-chain alkoxy silanes and in particular mercaptan- and pyridine-terminated silanes.…”
Section: Introductionmentioning
confidence: 99%