2013
DOI: 10.1016/j.vacuum.2013.03.016
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Nanocrystalline thin films with charge density wave ground state

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Cited by 2 publications
(4 citation statements)
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“…At the same temperature, the Raman-active CDW amplitude mode appears in fs-TRS [3,5]. The films with lower resistance and a more pronounced anomaly at 150 K also had better texture, the grains preferably ordered in orthogonal directions, as observed by atomic force microscopy (AFM) [4,5].…”
Section: Introductionmentioning
confidence: 90%
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“…At the same temperature, the Raman-active CDW amplitude mode appears in fs-TRS [3,5]. The films with lower resistance and a more pronounced anomaly at 150 K also had better texture, the grains preferably ordered in orthogonal directions, as observed by atomic force microscopy (AFM) [4,5].…”
Section: Introductionmentioning
confidence: 90%
“…AFM images of the examined films show granular structure [3,5]. Individual grains are elongated, ranging from 50 to 150 nm in width, and 150 to 200 nm in length.…”
Section: Morphology Of K 03 Moo 3 Thin Filmsmentioning
confidence: 96%
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