Crystalline Silicon - Properties and Uses 2011
DOI: 10.5772/23355
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Nanocrystalline Porous Silicon

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Cited by 20 publications
(24 citation statements)
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References 135 publications
(136 reference statements)
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“…Peak #4 is attributed to oxygen-deficient centers (ODCs); it appears at 300 °C with a sharp increase after 450 °C. In accordance with refs and , oxygen mobility occurs in this temperature range. From this point of view, our assignment is in agreement with ref , where the presence of ODC of about 1.8 eV was concluded.…”
Section: Resultssupporting
confidence: 91%
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“…Peak #4 is attributed to oxygen-deficient centers (ODCs); it appears at 300 °C with a sharp increase after 450 °C. In accordance with refs and , oxygen mobility occurs in this temperature range. From this point of view, our assignment is in agreement with ref , where the presence of ODC of about 1.8 eV was concluded.…”
Section: Resultssupporting
confidence: 91%
“…The #5th peak appears at high temperatures (450–550 °C). According to refs , and , this energy range is typical for the luminescence of silicon clusters with sizes under 25 nm . The spectral position of deconvoluted peaks varies slightly for the luminescence spectra obtained at different temperatures because of structural changes in silicon–oxygen and organic parts during heating.…”
Section: Resultsmentioning
confidence: 85%
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“…This clearly indicates the abundance of Zn atoms and existence of sulfur vacancy, which may strongly influence the emission characteristics of Si/ZnS heterojunctions. Since the presence of a native oxide can strongly influence the carrier transport across the junction in Si-based heterojunction devices, XPS analysis has also been used to probe the Si/ZnS interface. For this, we performed XPS depth profile analysis by sputter-etching the outer ZnS layer with 2.0 keV Ar + ions until the signal from the Si core is detected.…”
Section: Resultsmentioning
confidence: 99%
“…The Ag/Ag 2 O layer with a large number of interfacial traps exhibits the Fermi-level pinning at the Ag/Ag 2 O interface. This can block the electrical response of the Ag/Ag 2 O layer . However, the Ag/Ag 2 O layer with thin Ag films, which has a small number of interfacial traps, reveals an unpinned Fermi level and attains more stable and reliable electrical contact than thick films.…”
Section: Resultsmentioning
confidence: 99%