1997
DOI: 10.1557/jmr.1997.0406
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Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C60 tip

Abstract: The new procedure for the hardness measurements of superhard materials including diamond using the scanning force microscope with the ultrahard fullerite C60 tip was developed. It is shown that diamond is plastically deformed under the indentation by the ultrahard fullerite indenter at room temperature. Now the correct measurements of diamond hardness have become possible. The hardness values measured are 137 ± 6 and 167 ± 5 GPa for the diamond faces (100) and (111), respectively.

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Cited by 58 publications
(13 citation statements)
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“…Hardness measurements were performed on the submicron length scale using the NanoScan (NS) measurement system based on the principles of the scanning force microscopy [26][27][28]. Earlier this measurement method for hardness was tested on other hard and superhard materials, including the hardness measurements of c-BN, diamond and ultrahard fullerite [27,28].…”
Section: Methodsmentioning
confidence: 99%
“…Hardness measurements were performed on the submicron length scale using the NanoScan (NS) measurement system based on the principles of the scanning force microscopy [26][27][28]. Earlier this measurement method for hardness was tested on other hard and superhard materials, including the hardness measurements of c-BN, diamond and ultrahard fullerite [27,28].…”
Section: Methodsmentioning
confidence: 99%
“…All large crystals are not monolythic material, but consist of smaller particles. These fine particles were studied on a Nanoscan scanning probe microscope-nanoindenter to determine the properties of a particle on the nanoscale level [3]. The scanning window was 4.9 m × 4.9 m × 0.3 m. Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The presented experimental results were obtained using a scanning nano-hardness tester NanoScan [13,[18][19][20][21]. This device is capable of doing scratch tests, instrumented indentation and fast scanning probe microscopy (SPM)-like imaging of high quality using the same diamond indenter.…”
Section: Methodsmentioning
confidence: 99%