NAND Flash Relationship Between the Initial State of Non-Volatile Memory Cycling Endurance and the High Temperature Data Retention Ability of Post Cycling

Chia-Sheng, Huang; Liao, Yun-Chi

doi:10.1109/ipfa53173.2021.9617368

2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2021

DOI: 10.1109/ipfa53173.2021.9617368

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NAND Flash Relationship Between the Initial State of Non-Volatile Memory Cycling Endurance and the High Temperature Data Retention Ability of Post Cycling

Huang Chia-Sheng

Yun-Chi Liao

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NAND Flash Relationship Between the Initial State of Non-Volatile Memory Cycling Endurance and the High Temperature Data Retention Ability of Post Cycling

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