Mylar secondary emission-energy distribution and yields

Abstract

We have characterized Mylar by determining the emission yield and energy spectrum of emitted secondary electrons. In this study we used a conventional electron accelerator apparatus to which we have made some important adjustments, especially to determine the normalized energy distribution. These adjustments allowed us to obtain the data necessary to calculate reduced yield curves, (/ M vs. E/E M ) in which the secondary emission yields and the Energy of the fixed energy beam were both divided by their maximum values. Results for the total emission yield (), backscattered electrons () and "true secondary emission" electrons () were obtained as a function of the energy of the incident electron beam (E). The results from an experiment where the incident beam was vertically striking a Mylar sample (thickness 36 μm) are presented. The location of the first and second crossover points, where =1, as well as the energy spectrum of secondary electron emission using a planar symmetry arrangement for energies of 1.2 and 1.4 keV were obtained and presented.

Energy distribution of secondary electrons from gold on teflon-FEP

“…, from ref. [21], results in the following: In maintaining P I as a constant and a varying V S , equations (8) and 9are a function of V S . In practice, it is possible to vary V S through V 2 (see Figure 1).…”

“…For insulating samples, it is still less common to find data about the energy distribution of the secondary electrons [19]. In the case of insulation, there is an additional experimental difficulty that involves the charges created during the emission process, which may be the reason that this type of measure is less common; however, more recently, some studies have presented research on the energy spectrum of the secondary electrons for metals and polymers [20][21][22][23][24][25].…”