MuTCR: Test Case Recommendation via Multi-Level Signature Matching

Sun, Weisong; Qian, Weidong; Luo, Bin; Chen, Zhenyu

doi:10.1109/ast58925.2023.00022

2023 IEEE/ACM International Conference on Automation of Software Test (AST) 2023

DOI: 10.1109/ast58925.2023.00022

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MuTCR: Test Case Recommendation via Multi-Level Signature Matching

Weisong Sun

Weidong Qian

Bin Luo

et al.

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MuTCR: Test Case Recommendation via Multi-Level Signature Matching

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References 46 publications

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