2006
DOI: 10.1002/app.25107
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Multiwavelength interferometry and competing optical methods for the thermal probing of thin polymeric films

Abstract: Multiple-wavelength interferometry (MWI), a new optical method for the thermal probing of thin polymer films, is introduced and explored. MWI is compared with two standard optical methods, single-wavelength interferometry and spectroscopic ellipsometry, with regard to the detection of the glass transition temperature (T g ) of thin supported polymer films. Poly(methyl methacrylate) films are deposited by spin coating on Si and SiO 2 substrates. MWI is also applied to the study of the effect of film thickness (… Show more

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Cited by 15 publications
(6 citation statements)
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“…Utilization of optically transparent casings for iCVD reactors enables real‐time determination of film thickness, allowing the user to terminate the deposition once the desired result has been achieved 5, 188, 252, 253. Single and multiple wavelength interferometry have also been used for in situ probing of the thermal properties of polymeric thin films 254, 255…”
Section: Characteristics Of Cvd Polymersmentioning
confidence: 99%
“…Utilization of optically transparent casings for iCVD reactors enables real‐time determination of film thickness, allowing the user to terminate the deposition once the desired result has been achieved 5, 188, 252, 253. Single and multiple wavelength interferometry have also been used for in situ probing of the thermal properties of polymeric thin films 254, 255…”
Section: Characteristics Of Cvd Polymersmentioning
confidence: 99%
“…The nitroaromatic flow was then turned off, and the chamber was purged with clean N 2 for 5 min. The films' thickness changes due to swelling was monitored via single wavelength interferometry [41] using a 633 nm HeNe laser (JDS Uniphase). For resistance measurements, the wire leads were fed through the chamber's seals in order to log electrical resistance as a function of time with a standard multimeter.…”
Section: Methodsmentioning
confidence: 99%
“…Optical interferometry (OPTI) measurements were recorded on an experimental setup. The OPTI method is applied for the in situ monitoring in a single run of glass transitions of thin polymeric films on Si wafers.The glass transition is monitored by the slope differentiation of the interference line, and T g is obtained at the intersection of the two linear parts. OPTI measurements were obtained exclusively from the first heating cycle.…”
Section: Methodsmentioning
confidence: 99%