This article develops reliability models for systems subject to two dependent competing failure processes, considering the correlation between additional damage size on degradation in soft failure process and stress magnitude of shock load in hard failure process, both of which are caused by the same kth random shock. The generalized correlative reliability assessment model based on copulas is proposed, which is then extended to three different shock patterns: (1) δ‐shock, (2) m‐shock, and (3) m‐run shocks. There are some statistical works to be introduced in reliability modeling, including data separation of total degradation amount, inferring the distribution of amount of aging continuous degradation at time t, and fitting copula to the specific correlation. The developed reliability models are demonstrated for an application example of a micro‐electro‐mechanical system.