Multitechnique Fusion of Imaging Data for Heterogeneous Materials

Imaging XPS for industrial applications

“…Correlation with other techniques which can also capture size and homogeneity, such as those mentioned herein, can provide incredibly valuable information in a complete analysis of a surface material [59,63]. Great developments in such correlated analysis has been made by Fulghum and co-workers, who have successfully correlated imaging XPS with AFM, FTIR and confocal microscopy [20,33,34,64,65], whilst others have sought to correlate quantitative imaging XPS with electron backscatter diffraction (ESBD) for corrosion of grain boundaries [44].…”