Multispot model of contacts based on surface features

Malucci, R.D.

doi:10.1109/holm.1990.113069

Cited by 53 publications

(19 citation statements)

References 6 publications

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“…The size and distribution of a-spots will both have influence on this interacting resistance, often cited discussion can be found in [8], [25,26], more recently by [27,28], and [29,30]. The formula of Holm was given as:…”

Section: Analytical Model : Electrical Conduction In A-spotsmentioning

confidence: 99%

An Asperity-Based Finite Element Model for Electrical Contact of Microswitches

Liu

Leray

Pons

et al. 2013

2013 IEEE 59th Holm Conference on Electrical Contacts (Holm 2013)

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Abstract-Precise prediction of electrical contact resistance is important for microswitches. The contact spot used to be considered as a circle in earlier literature, where there was only one geometrical parameter: the radius of the a-spots. However, a real contact asperity has a height and an angle with the interface. In this paper, a 3-dimensional cone-truncated geometry is used to model an asperity, and three parameters are defined: radius, height and the angle of the side with respect to the surface plane. The ranges of their values are extracted from AFM measurement of samples in Au and Ru, and the values match well with the previous mechanical simulation results.Compared to the theoretical results, the finite element (FE) model showed a good capability to predict contact resistance in the diffusive regime, but underestimated it in the ballistic regime. The effects of angle and height of the asperity were investigated for Au-Ru contact in terms of contact resistance, maximum temperature and its location. Regarding multiple spots in contact, this work investigated the influence of the number of spots and their distributions for contact resistance and local Joule heating.

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Section: Analytical Model : Electrical Conduction In A-spotsmentioning

confidence: 99%

An Asperity-Based Finite Element Model for Electrical Contact of Microswitches

Liu

Leray

Pons

et al. 2013

2013 IEEE 59th Holm Conference on Electrical Contacts (Holm 2013)

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“…If we equate all three fluxes, we obtain a boundary condition for the inner radius of the spherical domain, Eqn. (38). …”

Section: S Vmentioning

confidence: 99%

“…Our approach follows much of Malucci's extension of Greenwood's formalism to aging surfaces [38,39,41]. The model is presented below by first describing the macroscopic process of contact of a probe (or tine) with an aged surface, obtaining the macroscopic diameter of the contact and the distribution of pressures within the contact.…”

Section: Electrical Contact Resistance Modelmentioning

confidence: 99%

“…The resistance of each asperity is taken from Malucci's work [38,39,41], [43,49], where parallel resistance pathway is envisaged for each asperity, i, between direct metallic contact and between conduction through a partially conductive oxide/sulfide interfacial film. …”

Section: Electrical Contact Resistance Modelmentioning

confidence: 99%

“…while resistance for the ith asperity from an interfacial film is given by X which we also utilize in our model [38,39,41],. Let's go through these in detail.…”

Section: Electrical Contact Resistance Modelmentioning

confidence: 99%

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Modeling pore corrosion in normally open gold- plated copper connectors.

Battaile¹,

Moffat²,

Sun³

et al. 2008

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The goal of this study is to model the electrical response of gold plated copper electrical contacts exposed to a mixed flowing gas stream consisting of air containing 10 ppb H 2 S at 30 o C and a relative humidity of 70%. This environment accelerates the attack normally observed in a light industrial environment (essentially a simplified version of the Battelle Class 2 environment). Corrosion rates were quantified by measuring the corrosion site density, size distribution, and the macroscopic electrical resistance of the aged surface as a function of exposure time. A pore corrosion numerical model was used to predict both the growth of copper sulfide corrosion product which blooms through defects in the gold layer and the resulting electrical contact resistance of the aged surface. Assumptions about the distribution of defects in the noble metal plating and the mechanism for how corrosion blooms affect electrical contact resistance were needed to complete the numerical model. Comparisons are made to the experimentally observed number density of corrosion sites, the size distribution of corrosion product blooms, and the cumulative probability distribution of the electrical contact resistance. Experimentally, the bloom site density increases as a function of time, whereas the bloom size distribution remains relatively independent of time. These two effects are included in the numerical model by adding a corrosion initiation probability proportional to the surface area along with a probability for bloom-growth extinction proportional to the corrosion product 4 bloom volume. The cumulative probability distribution of electrical resistance becomes skewed as exposure time increases. While the electrical contact resistance increases as a function of time for a fraction of the bloom population, the median value remains relatively unchanged. In order to model this behavior, the resistance calculated for large blooms has been weighted more heavily. 5 CONTENTS

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