2016
DOI: 10.1002/sia.6046
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Multispectral optical imaging combinedin situwith XPS or ToFSIMS and principal component analysis

Abstract: All X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) instruments have optical cameras to image the specimen under analysis, and often to image the sample holder as it enters the system too. These cameras help the user find the appropriate points for analysis of specimens. However they seldom give as good images as stand-alone bench optical microscopes, because of the limited geometry, source/analyser solid angle and ultra-high-vacuum (UHV) design compromises.… Show more

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Cited by 2 publications
(1 citation statement)
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“…This demonstrative system is supported with an array of 12 LEDs of different nominal emission wavelengths. The LEDs are usually fixed on a printed circuit board (PCB) and their emission intensity is automatically controlled by a computer through an USB interface [ 67 ]. Each LED is sequentially switched on for a definite period during image acquisition and synchronized with the camera trigger using a pre-programmed microcontroller.…”
Section: Colour Hyperspectral and Multispectral Imagingmentioning
confidence: 99%
“…This demonstrative system is supported with an array of 12 LEDs of different nominal emission wavelengths. The LEDs are usually fixed on a printed circuit board (PCB) and their emission intensity is automatically controlled by a computer through an USB interface [ 67 ]. Each LED is sequentially switched on for a definite period during image acquisition and synchronized with the camera trigger using a pre-programmed microcontroller.…”
Section: Colour Hyperspectral and Multispectral Imagingmentioning
confidence: 99%