Multiscan Identification of Models of Physical Processes of Relaxation of Capacity of Semiconductor Barrier Structures

Krylov, Vladimir; Bogachev, A.M.; Bogachev, Aleksey; Пронин, Тимофей; Pronin, Timofey; Мищенко, Алексей; Mischenko, Aleksey

doi:10.30987/conferencearticle_5c19e6a391f660.48288909

CAD/EDA, Modeling and Simulation in Modern Electronics. Part 2 2018

DOI: 10.30987/conferencearticle_5c19e6a391f660.48288909

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Multiscan Identification of Models of Physical Processes of Relaxation of Capacity of Semiconductor Barrier Structures

Vladimir Krylov¹,

A.M. Bogachev²,

Aleksey Bogachev

et al.

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Multiscan Identification of Models of Physical Processes of Relaxation of Capacity of Semiconductor Barrier Structures

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