Proceedings of ASP-DAC/VLSI Design 2002. 7th Asia and South Pacific Design Automation Conference and 15h International Conferen
DOI: 10.1109/aspdac.2002.995000
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Multiple faults: modeling, simulation and test

Yong Chang Kim1,
V.D. Agrawal2,
K.K. Saluja3

Abstract: We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault.

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