1997
DOI: 10.1093/oxfordjournals.jmicro.a023486
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Multiple beam tilt microscopy for super resolved imaging

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Cited by 53 publications
(41 citation statements)
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“…This is possible because data with angular diversity provide both 3D information and phase contrast. 2D phase of thin samples can be computed from images taken at multiple illumination angles [20][21][22][23][24] because of asymmetry introduced in the pupil plane [25]. All of these approaches assume a thin sample; in thick samples, angle-dependent data usually represent tomographic information.…”
Section: Introductionmentioning
confidence: 99%
“…This is possible because data with angular diversity provide both 3D information and phase contrast. 2D phase of thin samples can be computed from images taken at multiple illumination angles [20][21][22][23][24] because of asymmetry introduced in the pupil plane [25]. All of these approaches assume a thin sample; in thick samples, angle-dependent data usually represent tomographic information.…”
Section: Introductionmentioning
confidence: 99%
“…Experimental exit wave function reconstructions using tilted illumination images have been performed successfully using a conventional TEM (Kirkland et al 1995(Kirkland et al , 1997, and have demonstrated an improvement in the limit of continuous information transfer from 0.2 nm to approximately 0.11 nm (Kirkland et al 1997). However, this represents a relatively modest improvement over the axial information limit for the instrument used (0.14 nm).…”
Section: Information Transfer For Tilted Illuminationmentioning
confidence: 99%
“…This can be achieved by restoring the exit plane wave of the electron beam propagating from the specimen from either a tilt or focal series of HRTEM images. [35][36][37] In doing so, several key aberrations…”
Section: Imaging and Characterization Of Molecules And 1d Crystals Fomentioning
confidence: 99%