Multiple-angle incidence resolution spectrometry: applications in nanoarchitectonics and applied physics
Nobutaka Shioya,
Taizo Mori,
Katsuhiko Ariga
et al.
Abstract:The cutting-edge thin film studies using the multiple-angle incidence resolution spectrometry (MAIRS) are introduced from the principle to forefront applications in a wide variety of research fields covering semiconductor material with respect to nanoarchitectonics. MAIRS basically reveals quantitatively optical anisotropy in thin films, which is mostly used for quantitative molecular orientation analysis of each chemical group for chemistry purposes. This works powerfully especially when the material has poor… Show more
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