2016
DOI: 10.1134/s1064226916010125
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Multiparametric measurements of epitaxial semiconductor structures with the use of one-dimensional microwave photonic crystals

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Cited by 4 publications
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“…In [47], it is proposed to implement a method for simultaneous measurement of the substrate thickness of a semiconductor structure, the thickness and conductivity of a heavily doped epitaxial layer, the mobility of free charge carriers in this layer using a one-dimensional microwave photonic crystal. The one-dimensional waveguide photonic crystal consisted of 11 layers, forming a structure of periodically alternating elements, each of which included two layers, was considered.…”
Section: Emerging Waveguide Technology 40mentioning
confidence: 99%
“…In [47], it is proposed to implement a method for simultaneous measurement of the substrate thickness of a semiconductor structure, the thickness and conductivity of a heavily doped epitaxial layer, the mobility of free charge carriers in this layer using a one-dimensional microwave photonic crystal. The one-dimensional waveguide photonic crystal consisted of 11 layers, forming a structure of periodically alternating elements, each of which included two layers, was considered.…”
Section: Emerging Waveguide Technology 40mentioning
confidence: 99%