Abstract:A scanning ion conductance microscope (SICM) has been developed, operating in several modes: DC mode, current modulation mode, and hopping mode. SICM employs a piezoelectric-inertial movement system. The nanoprobes, in the form of glass nanopipettes with an internal radius of r ~ 50 nm, have been created and tested. The current-voltage characteristics I (V) and current dependences on the distance between the probe and the sample I (z) (approach/withdrawal curves) were measured. Images of a polymeric test objec… Show more
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