Multimode quantitative scanning microwave microscopy of in situ grown epitaxial Ba1−xSrxTiO3 composition spreads

Chang, Kunok; Aronova, Maria A.; Famodu, Olugbenga O.; Takeuchi, Ichiro; Lofland, S. E.; Hattrick‐Simpers, Jason; Chang, Huibin

doi:10.1063/1.1427438

Cited by 55 publications

(41 citation statements)

References 22 publications

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“…6. Figure 21, from Chang et al, 85 shows the frequency dispersion of the dielectric constant, as measured by SMM. The fact that the broad peak is observed in the range x ¼ 0.2-0.4, where the Curie temperature is closest to room temperature (RT), indicates that there is coupling between the microwave field and with the local soft mode mediated by the presence of structural defects such as threading dislocations.…”

Section: Ferroelectric Piezoelectric and Multiferroic Materialsmentioning

confidence: 99%

Applications of high throughput (combinatorial) methodologies to electronic, magnetic, optical, and energy-related materials

Green

Takeuchi

Hattrick‐Simpers

2013

Journal of Applied Physics

223

189

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High throughput (combinatorial) materials science methodology is a relatively new research paradigm that offers the promise of rapid and efficient materials screening, optimization, and discovery. The paradigm started in the pharmaceutical industry but was rapidly adopted to accelerate materials research in a wide variety of areas. High throughput experiments are characterized by synthesis of a "library" sample that contains the materials variation of interest (typically composition), and rapid and localized measurement schemes that result in massive data sets. Because the data are collected at the same time on the same "library" sample, they can be highly uniform with respect to fixed processing parameters. This article critically reviews the literature pertaining to applications of combinatorial materials science for electronic, magnetic, optical, and energy-related materials. It is expected that high throughput methodologies will facilitate commercialization of novel materials for these critically important applications. Despite the overwhelming evidence presented in this paper that high throughput studies can effectively inform commercial practice, in our perception, it remains an underutilized research and development tool. Part of this perception may be due to the inaccessibility of proprietary industrial research and development practices, but clearly the initial cost and availability of high throughput laboratory equipment plays a role. Combinatorial materials science has traditionally been focused on materials discovery, screening, and optimization to combat the extremely high cost and long development times for new materials and their introduction into commerce. Going forward, combinatorial materials science will also be driven by other needs such as materials substitution and experimental verification of materials properties predicted by modeling and simulation, which have recently received much attention with the advent of the Materials Genome Initiative. Thus, the challenge for combinatorial methodology will be the effective coupling of synthesis, characterization and theory, and the ability to rapidly manage large amounts of data in a variety of formats. V C 2013 AIP Publishing LLC. [http://dx

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Section: Ferroelectric Piezoelectric and Multiferroic Materialsmentioning

confidence: 99%

Applications of high throughput (combinatorial) methodologies to electronic, magnetic, optical, and energy-related materials

Green

Takeuchi

Hattrick‐Simpers

2013

Journal of Applied Physics

223

189

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“…1͒. 13,14 The resulting average composition of the spread varies continuously form pure PTO at one end to pure CFO at the other. The detail of the spread synthesis is described in Ref.…”

mentioning

confidence: 99%

Tunable multiferroic properties in nanocomposite PbTiO3–CoFe2O4 epitaxial thin films

Murakami

Chang

Aronova

et al. 2005

Applied Physics Letters

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We report on the synthesis of PbTiO3–CoFe2O4 multiferroic nanocomposites and continuous tuning of their ferroelectric and magnetic properties as a function of the average composition on thin-film composition spreads. The highest dielectric constant and nonlinear dielectric signal was observed at (PbTiO3)85–(CoFe2O4)15, where robust magnetism was also observed. Transmission electron microscopy revealed a pancake-shaped epitaxial nanostructure of PbTiO3 on the order of 30 nm embedded in the matrix of CoFe2O4 at this composition. Composition dependent ferroics properties observed here indicate that there is considerable interdiffusion of cations into each other.

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“…Near-fi eld microwave microscopy allows local quantitative measurements of material permittivity and tunability. [19][20][21] In the particular system used in the presented experiments and shown in Figure 1 a (PrimeNano installed on an Asylum Research MFP-3D AFM), the probe is made as a cantilever tip compatible with an AFM microscope. Microwaves of a frequency of a few GHz are sent through a coaxial cable to the probe in contact with the sample.…”

Section: Theorymentioning

confidence: 99%

Quantitative Nanometer‐Scale Mapping of Dielectric Tunability

Tselev

Klein

Gaßmann

et al. 2015

Adv Materials Inter

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usual approach to characterization of the thin fi lms dielectric properties assumes fabrication of sandwich (parallel-plate) or planar (interdigitated) capacitors or coplanar waveguides from micrometer to tens and hundreds of micrometers in dimensions. [5][6][7] Apparently, such approach is capable of delivering information only about fi lm properties averaged over a relatively large area. While this can be appropriate for single-crystalline epitaxial thin fi lms, the information about properties of single morphological elements of polycrystalline fi lms-such as fabricated by magnetron sputtering-cannot be obtained. Additionally, only macroscopic scale devices can be characterized. Fabrication of test devices is destructive for thin fi lms with a consequence that generally, characterized fi lms cannot be further used for fabrication of desired functional structures.Furthermore, a problem for polycrystalline fi lms are always pinholes leading to shorts in capacitor structures. The density of the pinholes increases with decreasing fi lm thickness, so that sample with a thicknesses of about 50 nm and below are hardly accessible to the measurements with lithographically fabricated capacitor structures since the electrodes should be made very small. On the other side, in general, thinner fi lms show worse performance than thicker fi lms, often related to "dead layers," i.e., layers with reduced permittivity and tunability at the electrode interfaces. A possibility to measure dielectric properties without top electrodes can help to discriminate between dead layers at bottom and at top electrodes as well as fi lm defects and, therefore, guide the development of improved bottom or top electrodes in the tunable devices. Therefore, noninvasive and nondestructive characterization methods capable of a high spatial resolution are required. The scanning probe techniques offer the opportunity of accessing the dielectric properties of nanoscale thin fi lms without the extensive effort of lithographically structured electrodes.In this paper, we used two scanning probe microscopy techniques-near-fi eld scanning microwave microscopy (SMM) and piezoresponse force microscopy (PFM)-to characterize and image tunability in a thin paraelectric fi lm. Using a polycrystalline Ba 0.6 Sr 0.4 TiO 3 (BST) fi lm as a model system, we prove that near-fi eld microwave imaging and PFM provide similar information about dielectric tunability with high spatial resolution in the 10's of nm regime. This is key to understand the origin of macroscopic material properties and its correlation to the underlying microstructure and defects as pathway for material Two scanning probe microscopy techniques-near-fi eld scanning microwave microscopy (SMM) and piezoresponse force microscopy (PFM)-are used to characterize and image tunability in a thin (Ba,Sr)TiO 3 fi lm with nanometer scale spatial resolution. While sMIM allows direct probing of tunability by measurement of the change in the dielectric constant, in PFM, tunability can be extracted via electrostrict...

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Multimode quantitative scanning microwave microscopy of in situ grown epitaxial Ba1−xSrxTiO3 composition spreads

Cited by 55 publications

References 22 publications

Applications of high throughput (combinatorial) methodologies to electronic, magnetic, optical, and energy-related materials

Applications of high throughput (combinatorial) methodologies to electronic, magnetic, optical, and energy-related materials

Tunable multiferroic properties in nanocomposite PbTiO3–CoFe2O4 epitaxial thin films

Quantitative Nanometer‐Scale Mapping of Dielectric Tunability

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