1993
DOI: 10.1063/1.109732
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Multifunctional probe microscope for facile operation in ultrahigh vacuum

Abstract: A scanning force/tunneling microscope (SFM/STM) for remote controlled operation in ultrahigh vacuum (UHV) is described. The lateral forces, normal forces, and tunneling currents between probe tip and sample can all be measured simultaneously. The optical beam deflection detector and the sample position can be adjusted by means of three compact inertial stepping motors. An UHV-compatible light emitting diode is introduced as a general alternative to the widely used laser diode in the detector. Images, taken at … Show more

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Cited by 176 publications
(91 citation statements)
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“…The set-up of our SFM is based on the beam-deflection principle [28] and equals the design of Howald et al [29]. The dynamic mode of the SFM is realized as described in [30] and further characterized in [31,32].…”
Section: Imaging Modesmentioning
confidence: 99%
“…The set-up of our SFM is based on the beam-deflection principle [28] and equals the design of Howald et al [29]. The dynamic mode of the SFM is realized as described in [30] and further characterized in [31,32].…”
Section: Imaging Modesmentioning
confidence: 99%
“…The setup of our SFM is described in references. [37][38][39][40][41] Dynamic SFM measures the change in frequency, ⌬f, that appears due to the interaction of the oscillating tip with the surface. 11,12 In order to measure the detuning with high precision and stability, we used a digital demodulator ͑EasyPLL, nanoSurf AG͒.…”
Section: B Scanning Force Imagingmentioning
confidence: 99%
“…The NaCl(001) sample surface was cleaved in a ultrahigh vacuum (UHV) chamber and analyzed using a home-built AFM 18 Atomic-scale friction force loops measured on NaCl(001) in UHV at room temperature with (dark blue) and without (light blue) lateral vibrations. Rs = vst is the cantilever position averaged over the vibrations.…”
mentioning
confidence: 99%