2023
DOI: 10.1039/d3nr02103c
|View full text |Cite
|
Sign up to set email alerts
|

Multifunctional metal selenide-based materials synthesized via a one-pot solvothermal approach for electrochemical energy storage and conversion applications

Abstract: High-efficient electroactive materials with distinct electrochemical features, along with suitable strategies to prepare hetero-nanoarchitectures incorporating two/more transition-metal selenides, are currently required to increase charge-storage ability. In this study, one-pot solvothermal...

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
3
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(3 citation statements)
references
References 80 publications
(83 reference statements)
0
3
0
Order By: Relevance
“…[18] Meanwhile, the lattice fringe with a d-spacing of 0.272 nm was indexed to the (101) crystal facets of the hexagonal Ni 0.85 Se (JCPDS: 00-018-0888). [20] There exists a clear interface between NiSe 2 and Ni 0.85 Se. Therefore, it could be speculated the presence of NiSe 2 and Ni 0.85 Se in the NiSe 2 /Ni 0.85 Se-2h electrocatalyst after the HER test.…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…[18] Meanwhile, the lattice fringe with a d-spacing of 0.272 nm was indexed to the (101) crystal facets of the hexagonal Ni 0.85 Se (JCPDS: 00-018-0888). [20] There exists a clear interface between NiSe 2 and Ni 0.85 Se. Therefore, it could be speculated the presence of NiSe 2 and Ni 0.85 Se in the NiSe 2 /Ni 0.85 Se-2h electrocatalyst after the HER test.…”
Section: Resultsmentioning
confidence: 99%
“…In the edge of the NiSe 2 /Ni 0.85 Se-2h octahedra, the high-resolution lattice fringes, which exhibited diameters of about 0.150 nm, corresponded to the (201) crystal plane of hexagonal phase Ni 0.85 Se (JCPDS: 00-018-0888). [20] The detailed information of the standard hexagonal phase Ni 0.85 Se (JCPDS: 00-018-0888) card was listed in Table S2, Supporting Information. What is more, a clear boundary could be recognized between NiSe As presented in Figure 2a, the X-ray diffraction (XRD) tests have been executed to precisely explore the chemical compositions of the as-obtained different samples.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation