Multifrequency Kelvin probe force microscopy on self assembled molecular layers and quantitative assessment of images’ quality

Kopiec, Daniel; Jóźwiak, Grzegorz; Moczała, Magdalena; Sierakowski, Andrzej; Gotszalk, Teodor

doi:10.1016/j.ultramic.2018.08.002

Cited by 4 publications

(15 citation statements)

References 17 publications

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“…We therefore referred to more complex, but broader term of ICC. The unit for the ICC measure is the bit per micrometre (b µm −1 ), which is calculated as the relation of the wavelet-based spectral power density of the information signal to the total spectral power density [14,15].…”

Section: Scanning Processmentioning

confidence: 99%

“…The obtained results make it possible to identify the composition of the imaged specimen. The recorded topography and thermal images are analysed using the information capacity theorem [13][14][15], which indicates at which transformer bridge bias conditions the optimal measurements are performed.…”

Section: Introductionmentioning

confidence: 99%

“…This functionality is particularly attractive since information about potential improvements in image quality can often be acquired early in the measurement process. Therefore, we employ the maximum capacity of the information channel (information channel capacity (ICC)) measure proposed by Shannon [13] and subsequently adopted in various disciplines to measure the image quality [14,15,24]. Specifically, in SPM-based technologies, the ICC-based metric was first proposed by Kopiec et al [14] as the successful successor of the method to normalise variance in the power spectrum [24].…”

Section: Introductionmentioning

confidence: 99%

“…Therefore, we employ the maximum capacity of the information channel (information channel capacity (ICC)) measure proposed by Shannon [13] and subsequently adopted in various disciplines to measure the image quality [14,15,24]. Specifically, in SPM-based technologies, the ICC-based metric was first proposed by Kopiec et al [14] as the successful successor of the method to normalise variance in the power spectrum [24]. More recently, the use of the ICC measure for image quality assessment combined with the wavelet-based approach for power estimation has evolved further [15].…”

Section: Introductionmentioning

confidence: 99%

“…Although an ICC measure is a well-known tool recently adopted to assess the quality of SPM images (see, e.g. [14,15,24]), we briefly discuss its definition for the convenience of readers. The ICC metric is a function of bandwidth B and SNR (S/N) expressed as…”

Section: Introductionmentioning

confidence: 99%

See 4 more Smart Citations

Transformer bridge-based metrological unit for scanning thermal microscopy with resistive nanoprobes

Pruchnik,

Smagowski,

Badura

et al. 2024

Meas. Sci. Technol.

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Scanning probe microscopy (SPM) is a broad family of diagnostic methods. Common restraint of SPM is only surficial interaction with specimen, especially troublesome in case of complex volumetric systems, e.g. microbial or microelectronic. Scanning thermal microscopy (SThM) overcomes that constraint, since thermal information is collected from broader space. We present transformer bridge-based setup for resistive nanoprobe-based microscopy. With low-frequency (approx. 1 kHz) detection signal bridge resolution becomes independent on parasitic capacitances present in the measurement setup. We present characterization of the setup and metrological description – with resolution of the system 2 mK with sensitivity as low as 5 mV/K. Transformer bridge setup brings galvanic separation, enabling measurements in various environments, pursued for purposes of molecular biology. We present results SThM measurement results of high-thermal contrast sample of carbon fibers in an epoxy resin. Finally, we analyze influence of thermal imaging on topography imaging in terms of information channel capacity (ICC). We state that transformer bridge-based SThM system is a fully functional design along with low driving frequencies and resistive thermal nanoprobes by Kelvin Nanotechnology.

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Section: Scanning Processmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Transformer bridge-based metrological unit for scanning thermal microscopy with resistive nanoprobes

Pruchnik,

Smagowski,

Badura

et al. 2024

Meas. Sci. Technol.

Self Cite

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High-resolution, spatially-resolved surface potential investigations of high-strength metallurgical graphene using scanning tunnelling potentiometry

Gajewski

Kunicki

Sierakowski

et al. 2019

Microelectronic Engineering

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Wavelet-based information theory in quantitative assessment of AFM images’ quality

Pruchnik,

Putek,

Gotszalk

2024

Sci Rep

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The quantitative assessment of the image quality produced by atomic force microscopy (AFM) is an ongoing and challenging task. In our study, we demonstrate Shannon’s application of information theory for measuring image quality. Specifically, we propose quantifying the loss of image information due to the various distortion processes by exploring the relationship between image information based on the information channel capacity (ICC), spectral image representation, and visual quality. Since the ideal image is unavailable, the power and noise spectrum, the critical input information for the image quality evaluation, must be robustly estimated in the proposed method. The classical, most popular Welch method for spectral estimation uses an average of several windowed periodograms and can produce biased spectrum estimates. Therefore, in our work, we discuss an alternative technique based on the wavelet transform that can be applied to solve this challenging problem, specifically in the case of noisy, uncertain AFM measurements. Finally, we validate the performance of the enhanced ICC-wavelet-based algorithm with noisy measurement AFM data.

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Multifrequency Kelvin probe force microscopy on self assembled molecular layers and quantitative assessment of images’ quality

Cited by 4 publications

References 17 publications

Transformer bridge-based metrological unit for scanning thermal microscopy with resistive nanoprobes

Transformer bridge-based metrological unit for scanning thermal microscopy with resistive nanoprobes

High-resolution, spatially-resolved surface potential investigations of high-strength metallurgical graphene using scanning tunnelling potentiometry

Wavelet-based information theory in quantitative assessment of AFM images’ quality

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