2023
DOI: 10.1002/adma.202308599
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Multicrystalline Informatics Applied to Multicrystalline Silicon for Unraveling the Microscopic Root Cause of Dislocation Generation

Kenta Yamakoshi,
Yutaka Ohno,
Kentaro Kutsukake
et al.

Abstract: A comprehensive analysis of optical and photoluminescence images obtained from practical multicrystalline silicon wafers is conducted, utilizing various machine learning models for dislocation cluster region extraction, grain segmentation, and crystal orientation prediction. As a result, a realistic 3D model that includes the generation point of dislocation clusters is built. Finite element stress analysis on the 3D model coupled with crystal growth simulation reveals inhomogeneous and complex stress distribut… Show more

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“…In polycrystalline materials, under a given external force, the grain oriented in the direction with the maximum Schmid factor attains critical shear stress at an earlier stage, initiating slip. , However, due to the varying orientations of neighboring grains, namely, different slip system orientations, moving dislocations create dislocation pile-ups at grain boundaries. This accumulation of dislocations leads to stress concentration, resulting in an increased tensile strength and reduced ductility in ECFs .…”
Section: Resultsmentioning
confidence: 99%
“…In polycrystalline materials, under a given external force, the grain oriented in the direction with the maximum Schmid factor attains critical shear stress at an earlier stage, initiating slip. , However, due to the varying orientations of neighboring grains, namely, different slip system orientations, moving dislocations create dislocation pile-ups at grain boundaries. This accumulation of dislocations leads to stress concentration, resulting in an increased tensile strength and reduced ductility in ECFs .…”
Section: Resultsmentioning
confidence: 99%