Multichannel detector for ion temperature determination in vacuum ultraviolet spectrum

Daltrini, A. M.; Machida, Munemasa

doi:10.1063/1.2742811

Cited by 4 publications

(6 citation statements)

References 10 publications

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“…This corresponds to the wavelength interval of about 370Å for each tokamak discharge. From this interval, only central region of about 200Å has been used for our data analysis in order to avoid signal intensity decrease at the CCD edge pixels [10]. The measured spectrum was then plotted in Figs.…”

Section: Experimental Results and Data Analysismentioning

confidence: 99%

“…However, such as reported in a previous work [10], higher diffraction order emissions, which usually are ignored, can provide better measurement results, due to the direct relationship of diffraction order number with resolution power and angular dispersion. In this article, spectral lines from 500Å to 1900Å measured in TCABR tokamak plasmas are presented.…”

Section: Introductionmentioning

confidence: 89%

“…A reducing coherent glass fiber array was used to couple the MCP to the CCD; more detail can be found in the ref. [10].…”

Section: Methodsmentioning

confidence: 99%

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VUV spectral line emission measurements in the TCABR tokamak

Machida¹,

Daltrini²,

Severo

et al. 2009

Braz. J. Phys.

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The study of tokamak plasma light emissions in the vacuum ultraviolet (VUV) region is an important subject since many impurity spectral emissions are present in this region. These spectral emissions can be used to determine the plasma ion temperature and density from different species and spatial positions inside plasma according to their temperatures. We have analyzed VUV spectra from 500Å to 3200Å wavelength in the TCABR tokamak plasma including higher diffraction order emissions. There have been identified 37 first diffraction order emissions, resulting in 28 second diffraction order, 24 third diffraction order, and 7 fourth diffraction order lines. The emissions are from impurity species such as OII, OIII, OIV, OV, OVI, OVII, CII, CIII, CIV, NIII, NIV, and NV. All the spectra beyond 1900Å are from higher diffraction order emissions, and possess much better spectral resolution. Each strong and isolated spectral line, as well as its higher diffraction order emissions suitable for plasma diagnostic is identified and discussed. Finally, an example of ion temperature determination using different diffraction order is presented.

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Section: Experimental Results and Data Analysismentioning

confidence: 99%

Section: Introductionmentioning

confidence: 89%

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VUV spectral line emission measurements in the TCABR tokamak

Machida¹,

Daltrini²,

Severo

et al. 2009

Braz. J. Phys.

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show abstract

“…A reducing coherent glass fiber array was used to couple the MCP to the CCD [1]. The MCP applied voltage has been kept constant at 650 V.…”

Section: Main Characteristicsmentioning

confidence: 99%

“…However, the Doppler broadening effect in the VUV region is much small than in the visible region, increasing therefore the temperature measurement errors. [1] One solution is to work with higher diffraction order, where the FWHM of line profile is increased whereas the instrumental broadening remains the same. Furthermore, in TCABR tokamak plasma [2] most of the impurity emissions occur in the VUV region, mainly at wavelengths below 155 nm, in our case, 37 first order emissions have been measured in this region [3].…”

Section: Introductionmentioning

confidence: 99%

Spectral Line Profile Analysis Using Higher Diffraction Order in Vacuum Ultraviolet Region

Machida¹,

Daltrini²,

Severo³

et al. 2008

AIP Conference Proceedings

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Abstract. Using a one meter VUV spectrometer and a MCP coupled to a CCD detector on TCABR tokamak, ion temperatures from impurity species have been measured and much better spectral resolution was obtained using higher order diffraction lines. Due to very small Doppler effect in the VUV region compared to large instrumental broadening, ion temperatures obtained from first order diffraction present large errors. The use of second, third and fourth order diffraction emissions increases the line broadening and results in lower error temperature measurements.

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Impurity Line Emissions in VUV Region of TCABR Tokamak

Machida¹,

Daltrini²,

Severo³

et al. 2008

AIP Conference Proceedings

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Abstract. Spectral emissions in the vacuum ultraviolet region from 50 nm to 320 nm have been measured on TCABR tokamak using an one meter VUV spectrometer and a MCP coupled to a CCD detector. Among the 98 emissions classified, 37 are from first order diffraction, 29 are from second order, 24 are from third order, 7 from fourth order, and one from fifth order diffraction. Main impurity lines are OII to OVII, CII to CIV, NIII to NV, FVII, besides working gas plasma hydrogen Lyman lines.

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Multichannel detector for ion temperature determination in vacuum ultraviolet spectrum

Cited by 4 publications

References 10 publications

VUV spectral line emission measurements in the TCABR tokamak

VUV spectral line emission measurements in the TCABR tokamak

Spectral Line Profile Analysis Using Higher Diffraction Order in Vacuum Ultraviolet Region

Impurity Line Emissions in VUV Region of TCABR Tokamak

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