Multi-wavelength pinhole point diffraction interferometry for optics metrology with interferometric intensity based phase retrieval method

Geng, Leqi; Li, Bing; Zhao, Zhuo; Lu, Jiasheng

doi:10.1016/j.optlaseng.2024.108198

Optics and Lasers in Engineering

2024

DOI: 10.1016/j.optlaseng.2024.108198

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Multi-wavelength pinhole point diffraction interferometry for optics metrology with interferometric intensity based phase retrieval method

Leqi Geng,

Bing Li,

Zhuo Zhao

et al.

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Multi-wavelength pinhole point diffraction interferometry for optics metrology with interferometric intensity based phase retrieval method

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References 17 publications

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