Multi – wavelength photodetectors based on porous spin-coated and compact RF-sputtered NiO films grown over Si substrate: Effect of surface morphology

Ahmed, Anas A.; Hashim, M.R.; Qahtan, Talal F.; Rashid, Marzaini

doi:10.1016/j.ijleo.2022.168694

Optik

2022

DOI: 10.1016/j.ijleo.2022.168694

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Multi – wavelength photodetectors based on porous spin-coated and compact RF-sputtered NiO films grown over Si substrate: Effect of surface morphology

Anas A. Ahmed

M.R. Hashim

Talal F. Qahtan

et al.

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Cited by 9 publications

References 47 publications

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Ultrahigh Performance UV Photodetector by Inserting an Al₂O₃ Nanolayer in NiO/n‐Si

Ma,

Tang,

Jia

et al. 2024

Adv Elect Materials

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Ultraviolet (UV) photodetectors have gained much attention due to their numerous important applications ranging from environmental monitoring to space communication. To date, most p‐NiO/n‐Si heterojunction photodetectors (HPDs) exhibit poor UV responsivity and slow response. This is mainly due to a small valence band offset (ΔEV) at the NiO/Si interface and a high density of dangling bonds at the silicon surface. Herein, an UV HPD consisting of NiO/Al2O3/n‐Si is fabricated using magnetron sputtering technique. The HPD has a large rectification ratio of 2.4 × 105. It also exhibits excellent UV responsivity (R) of 15.8 A/W at −5 V and and detectivity (D*) of 1.14 × 1013 Jones at −4 V, respectively. The excellent performance of the HPD can be attributed to the defect passivation at the interfaces of the heterojunction and the efficient separation of photogenerated carriers by the Al2O3 nanolayer. The external quantum efficiency (EQE) of the HPD as high as 5.4 × 103%, hence implying a large optical gain due to carrier proliferation resulting from impact ionization. Furthermore, the ultrafast response speed with a rise time of 80 µs and a decay time of 184 µs are obtained.

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Ultrahigh Performance UV Photodetector by Inserting an Al₂O₃ Nanolayer in NiO/n‐Si

Ma,

Tang,

Jia

et al. 2024

Adv Elect Materials

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Enhanced performance of annealed NiO thin film for UV photodetection

Chanu,

Alam,

Farhan

et al. 2023

Appl. Phys. A

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Blue emission of nano-crystalline NiO0.96 thin films doped with metallic copper

Hammad

Abdelwahab

2023

Indian J Phys

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Multi – wavelength photodetectors based on porous spin-coated and compact RF-sputtered NiO films grown over Si substrate: Effect of surface morphology

Cited by 9 publications

References 47 publications

Ultrahigh Performance UV Photodetector by Inserting an Al₂O₃ Nanolayer in NiO/n‐Si

Ultrahigh Performance UV Photodetector by Inserting an Al₂O₃ Nanolayer in NiO/n‐Si

Enhanced performance of annealed NiO thin film for UV photodetection

Blue emission of nano-crystalline NiO0.96 thin films doped with metallic copper

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Multi – wavelength photodetectors based on porous spin-coated and compact RF-sputtered NiO films grown over Si substrate: Effect of surface morphology

Cited by 9 publications

References 47 publications

Ultrahigh Performance UV Photodetector by Inserting an Al2O3 Nanolayer in NiO/n‐Si

Ultrahigh Performance UV Photodetector by Inserting an Al2O3 Nanolayer in NiO/n‐Si

Enhanced performance of annealed NiO thin film for UV photodetection

Blue emission of nano-crystalline NiO0.96 thin films doped with metallic copper

Contact Info

Product

Resources

About

Ultrahigh Performance UV Photodetector by Inserting an Al₂O₃ Nanolayer in NiO/n‐Si

Ultrahigh Performance UV Photodetector by Inserting an Al₂O₃ Nanolayer in NiO/n‐Si