Multi-view Sensing for Snapshot Pattern Recognition, Polarimetric and Phase Quantitative Microscopy

Fernández, Ariel

doi:10.1364/3d.2022.3w4a.4

Imaging and Applied Optics Congress 2022 (3D, AOA, COSI, ISA, pcAOP) 2022

DOI: 10.1364/3d.2022.3w4a.4

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Multi-view Sensing for Snapshot Pattern Recognition, Polarimetric and Phase Quantitative Microscopy

Ariel Fernández¹

Abstract: By exploiting the redundancy derived from multi-view sensing of a sample, image capture with different pupil masks under a lenslet array allows for snapshot pattern recognition, Stokes parameters retrieval as well as phase quantitative microscopy.

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Multi-view Sensing for Snapshot Pattern Recognition, Polarimetric and Phase Quantitative Microscopy

Abstract: By exploiting the redundancy derived from multi-view sensing of a sample, image capture with different pupil masks under a lenslet array allows for snapshot pattern recognition, Stokes parameters retrieval as well as phase quantitative microscopy.

Cited by 0 publications

References 4 publications

No citations

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