Multi-type SRAM Test Structure with an Improved March LR Algorithm

Ning, Xinshun; Yang, Hongyong; Zhang, Mengdi; Wang, Yanji; Zhao, Ye; Qiao, Shushan

doi:10.1109/apccas55924.2022.10090328

2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) 2022

DOI: 10.1109/apccas55924.2022.10090328

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Multi-type SRAM Test Structure with an Improved March LR Algorithm

Xinshun Ning

Hongyong Yang

Mengdi Zhang

et al.

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Multi-type SRAM Test Structure with an Improved March LR Algorithm

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References 13 publications

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