Multi-spectral (optical/IR and RF) characterization of omnidirectional reflective dielectric thin film for sensor applications

Zhu, Wen; Ternovskiy, Igor V.; Ding, Kung‐Hau; Park, James; Jang, Woo‐Yong

doi:10.1109/naecon.2016.7856789

2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) 2016

DOI: 10.1109/naecon.2016.7856789

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Multi-spectral (optical/IR and RF) characterization of omnidirectional reflective dielectric thin film for sensor applications

Wen Zhu

Igor V. Ternovskiy

Kung‐Hau Ding

et al.

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Multi-spectral (optical/IR and RF) characterization of omnidirectional reflective dielectric thin film for sensor applications

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References 7 publications

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