Abstract:In flexible electronics, the fatigue reliability of film interconnects will directly affect the stability of the entire device. Since the thickness of the film material is usually much smaller than its length and width, the fatigue of film interconnects exhibits significant size effects. To evaluate the reliability of film interconnects, based on the theory of continuum damage mechanics, a multi-scale damage model considering length-scale effect is established. For the convenience of the model application in d… Show more
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