2017
DOI: 10.1063/1.4978323
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Multi-point measurement using two-channel reflectometer with antenna switching for study of high-frequency fluctuations in GAMMA 10

Abstract: A two-channel microwave reflectometer system with fast microwave antenna switching capability was developed and applied to the GAMMA 10 tandem mirror device to study high-frequency small-amplitude fluctuations in a hot mirror plasma. The fast switching of the antennas is controlled using PIN diode switches, which offers the significant advantage of reducing the number of high-cost microwave components and digitizers with high bandwidths and large memory that are required to measure the spatiotemporal behavior … Show more

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Cited by 5 publications
(5 citation statements)
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“…Their azimuthal mode numbers are the same, m = -1, and radial profiles are the same eigenmode-like structure. In a previous study using the reflectometer system with less antennas, the difference among the AIC waves other than those frequencies was firstly indicated along with an indication of axial standing wave structure from the 0 and π axial phase differences [3]. From figure 3, we can see that the relative strength among the visible four peaks is surely varied in the axial direction.…”
Section: Axially Varied Relative Strength Among Spontaneously Excited...mentioning
confidence: 88%
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“…Their azimuthal mode numbers are the same, m = -1, and radial profiles are the same eigenmode-like structure. In a previous study using the reflectometer system with less antennas, the difference among the AIC waves other than those frequencies was firstly indicated along with an indication of axial standing wave structure from the 0 and π axial phase differences [3]. From figure 3, we can see that the relative strength among the visible four peaks is surely varied in the axial direction.…”
Section: Axially Varied Relative Strength Among Spontaneously Excited...mentioning
confidence: 88%
“…The latter operation was used in the experiment described in section 3. The more detailed information such as avoidance of the RF leak that is caused by the combination of two oscillators is described in the previous paper [3].…”
Section: Flexible Switchingmentioning
confidence: 99%
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“…Such a measurement can be provided by two schemes: one is microwave reflectometry and the other is the plasma light measurement. The former measures the electron density fluctuations induced by RF electric fields [1,2], and the method was used in several fusion devices such as DIII-D [3,4], GAMMA 10 [5,6], TST-2 [7,8] and LHD [2,9]. The advantage of microwave reflectometry is its high sensitivity, and the relative density fluctuations down to about 10 −5 was measured in LHD [2].…”
Section: Introductionmentioning
confidence: 99%