Multi-physics reliability simulation for solid state lighting drivers

Tarashioon, S.; Driel, W.D. van; Zhang, G. Q.

doi:10.1109/eurosime.2013.6529925

Cited by 3 publications

(3 citation statements)

References 15 publications

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“…where is a constant reference voltage, and is the overall current control resistance. Research in [26] has shown that the resistance of current control device degrades linearly with time. Thus, a linear degradation model for the overall current control resistance is assumed:…”

Section: B Led Drivermentioning

confidence: 99%

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A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation

Sun

Fan

Chen

et al. 2017

Reliability Engineering & System Safety

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In this paper, an integrated LED lamp with an electrolytic capacitor-free driver is considered to study the coupling effects of both LED and driver's degradations on lamp's lifetime. An electrolytic capacitor-less buck-boost driver is used. The physics of failure (PoF) based electronic thermal simulation is carried out to simulate the lamp's lifetime in three different scenarios: Scenario 1 considers LED degradation only, Scenario 2 considers the driver degradation only, and Scenario 3 considers both degradations from LED and driver simultaneously. When these two degradations are both considered, the lamp's lifetime is reduced by about 22% compared to the initial target of 25,000 hours. The results of Scenario 1 and 3 are close to each other. Scenario 2 gives erroneous results in terms of luminous flux as the LED's degradation over time is not taken into consideration. This implies that LED's degradation must be taken into considerations when LED and driver's lifetimes are comparable.

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Section: B Led Drivermentioning

confidence: 99%

“…For instance, the degradation distribution models, degradation path models and SPICE simulations have been integrated for a tolerance design [15]. A multi-physics simulation method has been used to predict the performance of an LED driver during degradations of semiconductor devices [26].…”

Section: Introductionmentioning

confidence: 99%

A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation

Sun

Fan

Chen

et al. 2017

Reliability Engineering & System Safety

View full text Add to dashboard Cite

show abstract

“…where V ref is a constant reference voltage and R ref is the overall current control resistance. Research in [44] has shown that the resistance of current control device degrades linearly with time. Thus, a linear degradation model for the overall current control resistance R ref is assumed:…”

Section: Led Drivermentioning

confidence: 99%

Reliability Prediction of Integrated LED Lamps with Electrolytic Capacitor-Less LED Drivers

Sun

Fan

Driel

et al. 2017

Solid State Lighting Reliability Part 2

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This chapter investigates the reliability of the integrated LED lamps with electrolytic capacitor-less LED drivers. Firstly, the impact of the interaction between the degradations of the LED light source and the driver on the lumen depreciation is studied. The electronic-thermal simulation was carried out to obtain the history of temperatures of LED and driver, the driver's output current, and the luminous flux considering the variations of temperature and current throughout the operation life. It is found that the ultimate lamp's lifetime is significantly less than the individual lifetimes of the preselected LED and driver. It is concluded that it is necessary to apply the electronic-thermal simulations to predict the lifetime of LED lamps when driver's lifetime is comparable to the LED's lifetime. Secondly, this chapter focuses on predicting the catastrophic failure of an electrolytic capacitorfree LED driver during the lumen depreciation process. Electronic-thermal simulations are utilized to obtain the lamp's dynamic history of temperature and

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