Multi-order Scaling of High-throughput Transmission Electron Microscopy

Own, Christopher S.; DeRego, T.; Own, Lawrence S.; Weppelman, G.; Wanner, Adrian; Ströh, Sebastian; Hammerschmith, Eric W.; Vishwanathan, Ashwin; Seung, H. Sebastian

doi:10.1017/s1431927619005932

Search citation statements

Order By: Relevance

Paper Sections

Select...

Discussion1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2022

2024

Publication Types

Select...

Preprint1

Article1

Relationship

Self Cite1

Independent1

Authors

Journals

Cited by 2 publications

(1 citation statement)

References 4 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…TEM imaging. Some components of the TEM systems have been briefly presented before 61 . The beam deflection module (Cricket, Voxa) for TEM has been prototyped previously 27 but not demonstrated for large-scale imaging.…”

Section: Discussionmentioning

confidence: 99%

Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy

Zheng

Own

Wanner

et al. 2022

Preprint

Self Cite

View full text Add to dashboard Cite

show abstract

Section: Discussionmentioning

confidence: 99%

Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy

Zheng

Own

Wanner

et al. 2022

Preprint

Self Cite

View full text Add to dashboard Cite

show abstract

Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy

Zheng,

Own,

Wanner

et al. 2024

Nat Commun

View full text Add to dashboard Cite

Serial section transmission electron microscopy (TEM) has proven to be one of the leading methods for millimeter-scale 3D imaging of brain tissues at nanoscale resolution. It is important to further improve imaging efficiency to acquire larger and more brain volumes. We report here a threefold increase in the speed of TEM by using a beam deflecting mechanism to enable highly efficient acquisition of multiple image tiles (nine) for each motion of the mechanical stage. For millimeter-scale areas, the duty cycle of imaging doubles to more than 30%, yielding a net average imaging rate of 0.3 gigapixels per second. If fully utilized, an array of four beam deflection TEMs should be capable of imaging a dataset of cubic millimeter scale in five weeks.

show abstract

Multi-order Scaling of High-throughput Transmission Electron Microscopy

Cited by 2 publications

References 4 publications

Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy

Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy

Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy

Contact Info

Product

Resources

About