2015
DOI: 10.1002/sia.5778
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Multi‐instrument characterization of poly(divinylbenzene) microspheres for use in liquid chromatography: as received, air oxidized, carbonized, and acid treated

Abstract: *We report a multi-instrument characterization of the carbon particles in carbon/polymer/nanodiamond core-shell materials used for high-performance liquid chromatography. These particles are prepared by the carbonization/pyrolysis of poly(divinylbenzene) (PDVB) microspheres. Scanning electron microscopy showed that the particles (4.9 μm initially) decreased in size after air oxidation (to 4.4 μm) and again after carbonization (down to 3.5 μm) but remained highly spherical. Brunauer-Emmett-Teller measurements s… Show more

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Cited by 6 publications
(7 citation statements)
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“…Figure e reveals diffused peaks appearing at the 2θ degree of about 13° and 22° which are ascribed to amorphous silica and crystalline Si, respectively. , These peaks were still evident in the XRD spectra of SiO 2 /DVB in Figure f; however, a broad peak at 2θ = 18° caused an overlap with the other peak of SiO 2 . According to Hung et al, this peak corresponds to DVB, which confirms the result of DVB being incorporated onto the pores of SiO 2 .…”
Section: Resultssupporting
confidence: 63%
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“…Figure e reveals diffused peaks appearing at the 2θ degree of about 13° and 22° which are ascribed to amorphous silica and crystalline Si, respectively. , These peaks were still evident in the XRD spectra of SiO 2 /DVB in Figure f; however, a broad peak at 2θ = 18° caused an overlap with the other peak of SiO 2 . According to Hung et al, this peak corresponds to DVB, which confirms the result of DVB being incorporated onto the pores of SiO 2 .…”
Section: Resultssupporting
confidence: 63%
“…33,34 These peaks were still evident in the XRD spectra of SiO 2 /DVB in Figure 1f; however, a broad peak at 2θ = 18°c aused an overlap with the other peak of SiO 2 . According to Hung et al, this peak corresponds to DVB, 19 which confirms the result of DVB being incorporated onto the pores of SiO 2 .…”
Section: Resultssupporting
confidence: 58%
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“…Nevertheless, ToF-SIMS provides more chemical information. ToF-SIMS does not give chemical state information about elements other than the hydrogen atom, and XPS is not sensitive to hydrogen . In addition, these techniques allow for the characterization of the changes in the contents of various functional groups immobilized onto the silica surface, which are associated with the method of silica fabrication, thermal history, or surface treatment …”
Section: Fundamentals Of High-performance Liquid Chromatographymentioning
confidence: 99%