2011
DOI: 10.1109/map.2011.6157759
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Multi-Frequency Planar Near-Field Scanning by Means of Singular-Value Decomposition (SVD) Optimization

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Cited by 23 publications
(33 citation statements)
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“…For such a problem, preliminary results have been presented in [30]. Here, we illustrate experimental results aimed at showing how the approach is capable to correctly reconstruct the intensity distribution of random radiators with a number of measurements which is significantly smaller than those required by more "standard" techniques, as it has been already proven in the CW, multi-frequency or narrow-band cases [21,22,30]. In this paper, random incoherent sources have been produced by properly slotting one of the walls of a reverberation chamber with one or more narrow apertures.…”
Section: Introductionmentioning
confidence: 94%
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“…For such a problem, preliminary results have been presented in [30]. Here, we illustrate experimental results aimed at showing how the approach is capable to correctly reconstruct the intensity distribution of random radiators with a number of measurements which is significantly smaller than those required by more "standard" techniques, as it has been already proven in the CW, multi-frequency or narrow-band cases [21,22,30]. In this paper, random incoherent sources have been produced by properly slotting one of the walls of a reverberation chamber with one or more narrow apertures.…”
Section: Introductionmentioning
confidence: 94%
“…According to the theory of the SVD approach, to reliably and accurately retrieve the subspace components of the source intensity, the matrix Z should have the best possible conditioning [19,21,22]. On the other hand, Z is not univocally defined, since it depends on the choice of both M , the number of sampling points, and the sample distribution.…”
Section: Optimal Sample Number and Locationsmentioning
confidence: 99%
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“…Regarding the former, it has been extensively shown that optimised sampling techniques [4][5][6][7] provide a dramatic reduction of the number of measurement points and of the scanning path length with respect to more conventional samplings, without impairing the reconstruction of the far-field pattern (FFP). Regarding the latter, the measurement time depends on different features, as the scanning hardware and geometry (planar, cylindrical or spherical scanning), the scanning controller and the measurement instrumentation (e.g.…”
Section: Introductionmentioning
confidence: 99%