Multi-Element Analysis by Portable Total Reflection X-ray Fluorescence Spectrometer

Abstract

Multi-element solutions containing the 11 elements S, K, Sc, V, Mn, Co, Cu, Ga, As, Br and Y were analyzed by a portable total reflection X-ray fluorescence (TXRF) spectrometer. The excitation parameters (glancing angle, operational voltage and current) and sample amount were optimized for the portable TXRF in order to realize the smallest possible detection limits for all elements. The excitation parameter dependencies of the fluorescence signal and background for the detected elements are explained in detail. Background contributed by the sample carrier is also discussed. Consequently, nine elements were detectable at sub-nanogram levels in a single measurement of 10 min under the optimal experimental conditions. The portable TXRF spectrometer was found to be suitable for simultaneous multi-element analysis with low detection limits. The features of high sensitivity, small sample amount required, and fast detection of a wide range of elements make the portable TXRF a valuable tool in various applications, such as field studies in environmental and geological investigations.

Pattern of Altered Plasma Elemental Phosphorus, Calcium, Zinc, and Iron in Alzheimer’s Disease

“…A key advantage of TXRF is the relatively simple sample preparation required compared to other techniques, contributing to its robust nature, with errors relating to pipetting small volumes rather than extraction efficiency of metals from biofluids or matrix effects. Other advantages include smaller analytical volumes needed (as low as 10 µl) 10 ; simple quantification using an internal standard; and simultaneous multi-element trace analysis without bias towards expected elemental compositions 11,12 . We aim to determine whether plasma phosphorus, calcium, iron, copper, selenium and zinc; and phosphorus/calcium ratio, differentiates between CN and AD individuals and may be putative peripheral biomarkers of AD.…”

2014 Atomic Spectrometry Update – a review of advances in X-ray fluorescence spectrometry

“…64 They analysed specimens containing ng amounts of Bi, REEs, Pb and Sb, including those with the previously mentioned overlap of Pb-L and As-K lines that were successfully deconvoluted. Liu et al, 67 also from the Kyoto team, published analytical results, using the same portable TXRF spectrometer, from solutions containing 11 elements. They studied the excitation parameters for optimum lower detection limits and reported sub ng levels for nine elements in a 10 minute measuring time.…”

Comparison of multiple X-ray fluorescence techniques for elemental analysis of particulate matter collected on air filters

“…The working distance was about 2 mm and the X-ray energy was 17.4 keV. Fluorescence radiation was measured by a Silicon-Drift Detector (SDD) with a sensitive area 10 mm 2 , energy resolution < 150 eV at 5.9 keV (Liu, Imashuku, & Kawai, 2013). X-Y-Z motor stage was used to determine the position of the sample to be analysed.…”

“…The non-monochromatic 200TX portable spectrometer is equipped with a W tube operating at 50 kV and 0.175 mA and air cooled SDD with 10 mm 2 active area. The maximum excitation energy is 9.5 keV (Liu et al, 2013). The incident rays were restricted to 10 mm width using by a waveguide slit at a grazing angle of 0.07° and a sampling area of 10 mm length by 8 mm width.…”