2000 International Conference on Simulation Semiconductor Processes and Devices (Cat. No.00TH8502)
DOI: 10.1109/sispad.2000.871208
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Multi-band simulation of interband tunneling devices reflecting realistic band structure

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Cited by 2 publications
(3 citation statements)
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“…They showed that multi-band description, together with fullband numerical integration and Hartree screening, are the key points for a quantitative correct RTD description. Similar results have also been found for AlAs/GaAs RTDs [244,248] and for interband Si-based diodes [239]. In particular, Ogawa et al [252] have investigated the effect of scattering mechanisms in RTDs within ETB.…”
Section: Tunnelling Devicessupporting
confidence: 65%
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“…They showed that multi-band description, together with fullband numerical integration and Hartree screening, are the key points for a quantitative correct RTD description. Similar results have also been found for AlAs/GaAs RTDs [244,248] and for interband Si-based diodes [239]. In particular, Ogawa et al [252] have investigated the effect of scattering mechanisms in RTDs within ETB.…”
Section: Tunnelling Devicessupporting
confidence: 65%
“…One of the main success of ETB is the multi-band treatment of tunnelling devices, such as Zener diodes [131,233,239] and resonant tunnelling devices. Here, valley mixing, a correct description of the band dispersion of evanescent states (complex band structure), band nonparabolicity, etc, make the ETB treatment well suited for accurate analysis.…”
Section: Tunnelling Devicesmentioning
confidence: 99%
“…In this paper, the tunnel junction is simulated using a rigorous quantum transport approach based on the nonequilibrium Green's function (NEGF) formalism as used in the nano-electronics community for the simulation of interband tunneling transistors [6][7][8][9][10] . In combination with atomistic electronic structure theory and self-consistent coupling to a Poisson solver, the approach is able to provide a realistic picture of the relevant density of states and associated current flow under non-equilibrium conditions, by accurately reflecting the effects of internal fields, carrier confinement and elastic as well as inelastic scattering mechanisms.…”
mentioning
confidence: 99%